This search combines search strings from the content search (i.e. "Full Text", "Author", "Title", "Abstract", or "Keywords") with "Article Type" and "Publication Date Range" using the AND operator.
Beilstein J. Nanotechnol. 2022, 13, 572–581, doi:10.3762/bjnano.13.49
Figure 1: Optical properties of a triangular MoSe2 flake covered with a thin film of 5 nm of CuPc. (a) Bright...
Figure 2: The local structure-related optical properties of CuPc/MoSe2. (a) Linear optical image of CuPc/MoSe2...
Figure 3: (a) Relative Raman enhancement factor at the center of the MoSe2 flake in reference to the SiO2/Si ...
Beilstein J. Nanotechnol. 2020, 11, 1147–1156, doi:10.3762/bjnano.11.99
Figure 1: a) High-resolution TEM image of a segment of a SiNW obtained through Pt-catalyzed growth that exhib...
Figure 2: a) Representative helium ion microscopy image of a SiNW, which is supported on a Au-coated Si wafer...
Figure 3: a) Confocal 20 × 20 µm2 image of two intersecting SiNWs on a gold substrate. The yellow square mark...
Figure 4: a) SEM image of the tip used. b) Optical image of the tip in focus. c) Polarization angle-resolved ...
Figure 5: a) A shear-force scanning probe microscopy topography image (250 × 250 nm2) of a silicon wire edge....
Figure 6: a) Topographical image of the top of a SiNW. The dashed arrow shows the region in which the 32 Rama...